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Recent Submissions

  • Tsui, S.; Baikalov, A.; Cmaidalka, J.; Sun, Y.Y.; Xue, Y.Y.; Chu, C.W. (Applied Physics Letters, 2004)
    We investigate the polarity-dependent field-induced resistive switching phenomenon driven by electric pulses in perovskite oxides. Our data show that the switching is a common occurrence restricted to an interfacial layer ...
  • Chu, C.W.; Chen, F.; Shulman, J.; Tsui, S.; Xue, Y.Y.; Wen, W.; Sheng, P. (Proceedings of the SPIE, 2005)
    The significance of a negative dielectric constant has long been recognized. We report here the observation of a field-induced large negative dielectric constant of aggregates of oxide nano-particles at frequencies below ...
  • Tsui, S.; Wang, Y.Q.; Xue, Y.Y.; Chu, C.W. (Applied Physics Letters, 2006)
    The polarity-dependent resistive switching across metal-Pr0.7Ca0.3MnO3 interfaces is investigated. The data suggest that shallow defects in the interface dominate the switching. Their density and fluctuation, therefore, ...
  • Shulman, J.; Tsui, S.; Chen, F.; Xue, Y.Y.; Chu, C.W. (Applied Physics Letters, 2007)
    A negative capacitance has been observed in a nanocolloid between 0.1 and 10−5 Hz. The response is linear over a broad range of conditions. The low-␻ dispersions of both the resistance and capacitance are consistent with ...
  • Price, E.; Tsui, S.; Salvo, C.; Lopez, M. (Journal of Applied Physics, 2012-12-11)
    Resistive switching phenomena induced by electric pulsing have been investigated for several years as a result of interest in memory technology development. We investigate the viability of bipolar resistive switching at ...